Premium
Epitaxial Growth of Vacuum‐Evaporated Co on NaCl. II. Analysis of Diffraction Patterns
Author(s) -
Otsuka K.,
Wayman C. M.
Publication year - 1967
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.19670220230
Subject(s) - electron diffraction , epitaxy , crystallography , diffraction , diffusionless transformation , lattice (music) , reciprocal lattice , materials science , condensed matter physics , molecular beam epitaxy , thin film , substrate (aquarium) , martensite , optics , chemistry , physics , geology , nanotechnology , microstructure , oceanography , acoustics , layer (electronics)
The existence of long streaks in 〈111〉 directions must be taken into consideration in order to consistently explain diffraction patterns from f.c.c. films in (001), (110), (111), and (211) orientations. In orientations other than (110) the apparent streaks correspond to the projection of 〈111〉 reciprocal lattice vectors onto the plane normal to the electron beam, and these are ascribed to buckling. The (110), (111), and (211) orientations are not thought to be truly epitaxial and appear to be associated with substrate irregularities. The epitaxially grown films are substantially f.c.c. containing many microtwins rather than f.c.c. films with h.c.p. regions which have transformed on {111} planes, indicating a suppression of the f.c.c. → h.c.p. martensitic transformation in thin films.