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X‐Ray Diffraction by Hexagonal Close‐Packed Crystals Containing Extrinsic Stacking Faults
Author(s) -
Lele S.,
Anantharaman T. R.,
Johnson Ch. A.
Publication year - 1967
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.19670200105
Subject(s) - stacking , diffraction , hexagonal crystal system , close packing of equal spheres , crystallography , deformation (meteorology) , crystal (programming language) , stacking fault , position (finance) , materials science , condensed matter physics , fault (geology) , x ray crystallography , geology , dislocation , chemistry , physics , optics , composite material , seismology , computer science , nuclear magnetic resonance , economics , programming language , finance
The diffraction pattern for a hexagonal close‐packed (h.c.p.) crystal containing extrinsic stacking faults is derived under the assumption that the crystal is infinite in size with faults covering entire basal planes and distributed at random. While deformation faults broaden reflections with H – K ≠ 0 mod 3, L = 0 mod 2 and H – K ≠ 0 mod 3, L = 1 mod 2 equally and growth faults broaden the former twice as much as the latter, extrinsic faults are shown to broaden the latter only. The broadening due to extrinsic faults is symmetric without any shift of the peak position, as in the cases of deformation and growth faulting.