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The fine structure of spots in electron diffraction resulting from the presence of planar interfaces and dislocations
Author(s) -
van Landuyt J.,
Gevers R.,
Amelinckx S.
Publication year - 1966
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.19660180135
Subject(s) - diffraction , stacking , planar , electron diffraction , materials science , rutile , transmission electron microscopy , crystallography , selected area diffraction , optics , condensed matter physics , molecular physics , chemistry , physics , nanotechnology , nuclear magnetic resonance , computer graphics (images) , organic chemistry , computer science
Observations show that diffraction patterns contain satellite spots due to the effect of stacking faults on the transmitted and scattered beams in transmission electron diffraction. The characteristics of this fine structure of the diffraction pattern are compared with the theoretical predictions derived in part I. An analysis is made of the fine structure in the diffraction patterns from rutile (TiO 2 ) crystals containing antiphase‐boundaries and from stainless steel foils containing stacking faults, and excellent agreement is found between theory and experiment.