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Dependence of the geometry of the formation of X‐ray diffraction lines on the instrumental factors in X‐ray investigations of polycrystals
Author(s) -
Davydov G. V.
Publication year - 1966
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.19660180103
Subject(s) - diffraction , reflection (computer programming) , line (geometry) , geometry , optics , x ray , point source , plane (geometry) , line source , physics , point (geometry) , position (finance) , mathematics , computer science , programming language , finance , economics
A stude is made of the dependence of the formation geometry of an X‐ray diffraction line on the instrumental factors for the case of recording the back‐reflection pattern from a polycrystalline flat‐layer specimen on a straight recording line lying in the focusing plane and parallel to the specimen plane. A general formula is derived for the position of the reflection of a ray that is emitted from any point of a three‐dimensional X‐ray source and reflected from the flat specimen at any point. A detailed study of the formation geometry of an X‐ray diffraction line is made for the two‐dimensional problem, the specimen and ray‐source having finite dimensions, and the focusing condition of the extreme rays holding. As for the three‐dimensional problem a solution is presented for the special case of the formation geometry of an X‐ray diffraction line for finite dimensions of the flat‐layer specimen and the point ray‐source under the focusing conditions of the extreme rays lying in the focusing plane. A number of examples has been selected for the calculations, the data are analysed and interpreted.