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Electromechanical Effect in Semi‐Metals
Author(s) -
Upit G. P.,
Varchenya S. A.,
Spalvin I. P.
Publication year - 1966
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.19660150222
Subject(s) - materials science , bismuth , electric field , indentation hardness , surface layer , antimony , layer (electronics) , surface (topology) , intensity (physics) , condensed matter physics , field (mathematics) , composite material , metallurgy , optics , geometry , microstructure , physics , mathematics , quantum mechanics , pure mathematics
The electromechanical effect representing a decrease of microhardness of the surface layer due to an electric field applied between the sample and the indenter is observed in the semimetals antimony and bismuth. The dependence of the magnitude of this effect upon load, electric field intensity and indenter orientation is investigated. The inconsistencies of the concepts regarding the mechanism of the photomechanical and electromechanical effects are discussed. An attempt is made to explain the effects on a common basis. It is suggested that an increase in the mobility of dislocations which appear on the surface is caused by a change of surface energy or bond metallization in a surface layer.