The Time‐of‐Flight Method for Investigations of Single‐Crystal Structures

A new method is described for neutron diffraction structure investigations of single crystals using the time‐of‐flight technique. A pulsed incident neutron beam is used, and the neutrons scattered from a single‐crystal sample within an angular range of Δθ are counted by means of a multi‐time‐channel analysing system. In this way the integrated intensities are measured for several reciprocal lattice points simultaneously. Two cases are discussed, one involving a large and the other a small range of scattering angles. The feasibility of the method has been demonstrated for single crystals of aluminium and chromium at the DR 3 reactor at Risö and at the EWA reactor at świerk.