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Electron Microscopic Study of Twins, Anti‐Phase Boundaries, and Dislocations in Thin Films of Rutile
Author(s) -
van Landuyt J.,
Gevers R.,
Amelinckx S.
Publication year - 1964
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.19640070127
Subject(s) - ribbon , condensed matter physics , materials science , dislocation , stacking fault energy , phase (matter) , stacking fault , stacking , transmission electron microscopy , boundary (topology) , diffraction , phase boundary , grain boundary , crystallography , optics , physics , chemistry , microstructure , composite material , mathematics , nuclear magnetic resonance , nanotechnology , mathematical analysis , quantum mechanics
Anti‐phase boundaries and dislocation ribbons are studied by means of transmission electron microscopy. From the fringe patterns observed at anti‐phase boundaries, and from the diffraction pattern, a model for anti‐phase boundaries may be proposed. It is found that the width of the ribbons changes on crossing certain anti‐phase boundaries. The model for the anti‐phase boundary deduced from the contrast effects allows this behaviour to be explained in a consistent way, because the model implies that the stacking fault energy is different in both domains for a ribbon extending both sides of a domain boundary. The difference in stacking fault energy causes a difference in ribbon width, and as a result also causes a difference in total energy per unit length of the ribbon. This difference in energy causes in turn a „refraction ” of ribbons at anti‐phase boundaries.