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Surface Photovoltage Spectroscopy over Wide Time Domains for Semiconductors with Ultrawide Bandgap: Example of Gallium Oxide
Author(s) -
Dittrich Thomas,
Fengler Steffen,
Nickel Norbert
Publication year - 2021
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.202100167
Subject(s) - surface photovoltage , semiconductor , spectroscopy , materials science , photon counting , optoelectronics , gallium , band gap , kelvin probe force microscope , wide bandgap semiconductor , surface states , gallium nitride , photon energy , gallium arsenide , deep level transient spectroscopy , photon , optics , nanotechnology , surface (topology) , physics , silicon , geometry , mathematics , layer (electronics) , quantum mechanics , metallurgy , atomic force microscopy
A nonconventional approach is proposed for the measurement of surface photovoltage (SPV) signals over very wide ranges in photon energy and time. Regimes for AC, DC, and combined AC–DC measurements are defined and applied for the characterization of a β‐Ga 2 O 3 crystal by transient and modulated SPV spectroscopy, spectroscopy in the mode of a Kelvin probe and single‐pulse SPV transients from 10 ns to 1000 s with the same electrode. Numerous electronic transitions are distinguished in β‐Ga 2 O 3 depending on the measurement regime, the time response and the history of measurement. An accumulation of negative charge at the surface of β‐Ga 2 O 3 is observed at long times independent whether the SPV signals are positive or negative before. The nonconventional approach of measuring SPV signals opens new opportunities for investigating electronic properties of semiconductors with ultrawide bandgaps and any other photoactive materials.