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Microstructural Analysis of Local Silicon Corrosion of Bifacial Solar Cells as Root Cause of Potential‐Induced Degradation at the Rear Side
Author(s) -
Sporleder Kai,
Naumann Volker,
Bauer Jan,
Richter Susanne,
Hähnel Angelika,
Großer Stephan,
Turek Marko,
Hagendorf Christian
Publication year - 2019
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.201970056
Subject(s) - passivation , degradation (telecommunications) , materials science , silicon , corrosion , damages , crystalline silicon , forensic engineering , metallurgy , composite material , electrical engineering , engineering , layer (electronics) , political science , law
Industrial bifacial PERC solar cells show a new type of potential induced degradation (PID) at the rear side. After PID stress, cells exhibit power losses about 12 % rel . The origin of the losses is traced back to a local silicon corrosion, forming hole shaped damages within the passivation layers at the rear side. More details can be found in article number 1900334 by Kai Sporleder, Christian Hagendorf, and co‐workers.