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The Role of Nanoparticles on Topographic Cross‐Talk in Electric Force Microscopy and Magnetic Force Microscopy
Author(s) -
Fuhrmann Marc,
Krivcov Alexander,
Musyanovych Anna,
Thoelen Ronald,
Möbius Hildegard
Publication year - 2020
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.201900828
Subject(s) - dielectric , nanoparticle , polystyrene , materials science , capacitive sensing , microscopy , capacitive coupling , magnetic nanoparticles , magnetic force microscope , electrostatic force microscope , nanotechnology , optics , analytical chemistry (journal) , atomic force microscopy , composite material , optoelectronics , chemistry , magnetic field , physics , magnetization , polymer , voltage , electrical engineering , engineering , quantum mechanics , chromatography
Topographic cross‐talk is still an issue in magnetic force microscopy (MFM) as well as in electric force microscopy (EFM). Using interleave mode measurements, combining a first topographic scan with a second scan in a certain distance from the surface following the topography from the first scan, capacitive coupling effects occur while measuring nanoparticles. This article focuses on the influence of the dielectric constant of polystyrene nanoparticles in interleave mode MFM measurements. To investigate the contribution of the capacitive coupling effect to the signal, nonmagnetic polystyrene nanoparticles are investigated. The tip‐substrate distance change above the nanoparticle leads to a positive phase shift in MFM signals. Simulations and fits to the experimental data allow the investigation of the influence of the dielectric constant of the nanoparticles on topographic effects in interleave mode measurements in general.