Premium
Tuning the Electrical Properties of Titanium Oxide Bilayers Prepared by Atomic Layer Deposition at Different Temperatures
Author(s) -
Gotoh Kazuhiro,
Mochizuki Takeya,
Kurokawa Yasuyoshi,
Usami Noritaka
Publication year - 2019
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.201900495
Subject(s) - atomic layer deposition , materials science , passivation , deposition (geology) , titanium , stacking , layer (electronics) , electrical resistivity and conductivity , oxide , chemical engineering , titanium oxide , nanotechnology , chemistry , metallurgy , paleontology , organic chemistry , engineering , sediment , electrical engineering , biology
Carrier‐selective contacts prepared by atomic layer deposition (ALD) have received significant attention for developing high‐efficiency solar cells. Herein, the electrical properties of titanium oxide (TiO x ) prepared by ALD are manipulated by modulating the deposition temperature during ALD. Tunable electrical properties are possible due to the existence of oxygen vacancies in TiO x prepared at low deposition temperatures. TiO x layers prepared at 100 and 150 °C provide a low contact resistivity and high passivation performance, respectively. A high carrier selectivity of 13.5 is achieved by stacking the TiO x layers prepared at 100 and 150 °C, compared with a single TiO x layer. Modulating the deposition temperature can, therefore, improve the electrical properties of ALD‐TiO x . This approach can be used to optimize the functionality of ALD‐based materials.
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom