Growth‐Parameter Dependence of Polarity and Electronic Transports in ZnO Thin Films Deposited by Magnetron Sputtering (Phys. Status Solidi A 16∕2018) | Zendy

Ohsawa Takeo | Zendy; Tsunoda Kei | Zendy; Dierre Benjamin | Zendy; Grachev Sergey | Zendy; Montigaud Hervé | Zendy; Ishigaki Takamasa | Zendy; Ohashi Naoki | Zendy

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Growth‐Parameter Dependence of Polarity and Electronic Transports in ZnO Thin Films Deposited by Magnetron Sputtering (Phys. Status Solidi A 16∕2018)

Author(s) -

Ohsawa Takeo,

Tsunoda Kei,

Dierre Benjamin,

Grachev Sergey,

Montigaud Hervé,

Ishigaki Takamasa,

Ohashi Naoki

Publication year - 2018

Publication title -

physica status solidi (a)

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.532

H-Index - 104

eISSN - 1862-6319

pISSN - 1862-6300

DOI - 10.1002/pssa.201870035

Subject(s) - polarity (international relations) , thin film , sputtering , materials science , sputter deposition , optoelectronics , photoemission spectroscopy , x ray photoelectron spectroscopy , zinc , analytical chemistry (journal) , chemistry , nanotechnology , metallurgy , chemical engineering , engineering , biochemistry , cell , chromatography

Zinc Oxide Thin Films Development of polarity control of ZnO films by photoemission spectroscopy: Controllable polarity enables us to understand complicated optoelectronic properties in nominally undoped ZnO films. This is reported by Takeo Ohsawa and co‐workers in article number 1700838 .

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