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Growth‐Parameter Dependence of Polarity and Electronic Transports in ZnO Thin Films Deposited by Magnetron Sputtering (Phys. Status Solidi A 16∕2018)
Author(s) -
Ohsawa Takeo,
Tsunoda Kei,
Dierre Benjamin,
Grachev Sergey,
Montigaud Hervé,
Ishigaki Takamasa,
Ohashi Naoki
Publication year - 2018
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.201870035
Subject(s) - polarity (international relations) , thin film , materials science , sputter deposition , sputtering , optoelectronics , zinc , photoemission spectroscopy , x ray photoelectron spectroscopy , condensed matter physics , nanotechnology , chemistry , nuclear magnetic resonance , physics , metallurgy , biochemistry , cell
Zinc Oxide Thin Films Development of polarity control of ZnO films by photoemission spectroscopy: Controllable polarity enables us to understand complicated optoelectronic properties in nominally undoped ZnO films. This is reported by Takeo Ohsawa and co‐workers in article number 1700838 .