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In Situ Characterization and Modification of β‐Ga 2 O 3 Flakes Using an Ion Micro‐Probe
Author(s) -
Peres Marco,
Alves Luis C.,
Rocha Flávia,
Catarino Norberto,
Cruz Carlos,
Alves Eduardo,
Silva Ana G.,
Víllora Encarna G.,
Shimamura Kiyoshi,
Lorenz Katharina
Publication year - 2018
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.201800190
Subject(s) - irradiation , characterization (materials science) , in situ , materials science , ion , proton , quenching (fluorescence) , analytical chemistry (journal) , radiation , nanotechnology , chemistry , optics , fluorescence , nuclear physics , physics , organic chemistry , chromatography
In situ characterization of β‐Ga 2 O 3 flakes during proton irradiation is performed using ionoluminescence and electrical measurements. The quenching of the native blue‐UV emission bands due to irradiation‐induced defects in real time is monitored by ionoluminescence. Measurements of the I–V characteristics during irradiation present a good response of Ga 2 O 3 for particle detection and a good radiation resistance.