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Incident light angle dependence of microwalled silicon solar cell efficiency for fracture transfer printing applications
Author(s) -
Yengel E.,
Karaagac H.,
Logeeswaran V. J.,
Saif Islam M.
Publication year - 2017
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.201600724
Subject(s) - materials science , solar cell , deep reactive ion etching , silicon , energy conversion efficiency , optoelectronics , photovoltaic system , fabrication , solar cell efficiency , optics , etching (microfabrication) , texture (cosmology) , substrate (aquarium) , angle of incidence (optics) , reactive ion etching , composite material , electrical engineering , alternative medicine , artificial intelligence , image (mathematics) , oceanography , pathology , computer science , layer (electronics) , medicine , physics , geology , engineering
Herein, we report the results in the search for optimized parameters to fabrication of substrate free microwalled photovoltaic devices for maximum light harvesting. By using the fracture transfer printing method, silicon (Si)‐based microwalls (MWs) and micropilars (MPs) with an aspect ratio of 24 were successfully fabricated and transferred into PMMA on secondary substrates. Also, MW solar cell with the filling ratio ∼40% was fabricated by further processing a commercial solar cell with surface texture using deep reactive ion etching (DRIE). The results show that reflection is minimized for light incidence angle greater than 5° with respect to the surface normal to the solar cell plane. The power conversion efficiency (PCE) of the MW PV device starts to increase from 2% as the incident light angle increases from 0° and reaches its maximum at 3.5% for 70°. On the other hand, a textured commercial solar cell, with PCE of 9.5% exhibits decreasing PCE when the incident light angle is varied from orthogonal to parallel orientation with respect to the solar cell plane.