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Influence of cryogenic temperatures on electrical properties of structures patterned by a laser in ITO/Ag/ITO layers
Author(s) -
Lebioda Marcin,
Pawlak Ryszard
Publication year - 2016
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.201532693
Subject(s) - materials science , electrical conductor , electrical resistivity and conductivity , laser ablation , optoelectronics , laser , electron mobility , hall effect , cryogenic temperature , composite material , optics , electrical engineering , engineering , physics
The electrical properties of highly conductive ITO/Ag/ITO multilayer film at cryogenic temperatures have been presented in the paper for the first time. A good electrical conductivity and high thermal resistance of ITO/Ag/ITO are desirable features at cryogenic temperatures. Elements in ITO/Ag/ITO (AgHT™) were patterned using fiber laser ablation. Close to a linear ( R 2 = 0.999) relationship between resistance and temperature in the range of 293–55 K was confirmed. The dynamics of resistance changes is of the order of 9 × 10 −4 1/K. Carrier concentration and mobility have been determined on the basis of Hall voltage measurements. Structures patterned in AgHT™ conductive film can be seen to be suitable for passive elements of low‐temperature electronics.