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I–V hysteresis of methylammonium lead halide perovskite films on microstructured electrode arrays: Dependence on preparation route and voltage scale
Author(s) -
Stumpp Martina,
Ruess Raffael,
Horn Jonas,
Tinz Jan,
Richter Christoph,
Schlettwein Derck
Publication year - 2016
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.201532527
Subject(s) - perovskite (structure) , materials science , halide , electrode , polarization (electrochemistry) , hysteresis , thin film , analytical chemistry (journal) , poling , optoelectronics , scanning electron microscope , nanotechnology , ferroelectricity , dielectric , inorganic chemistry , chemistry , composite material , condensed matter physics , crystallography , physics , chromatography
Methyl ammonium lead halide materials CH 3 NH 3 PbI 3 and CH 3 NH 3 Pb(I 0.95 Br 0.05 ) 3 were prepared as thin films via different established deposition techniques onto micro structured gold electrode arrays on Si/SiO 2 wafers. Scanning electron microscopy was performed to analyze the morphology of the different films. Electrical measurements of the samples showed hysteresis in the I – V characteristics for all samples in the dark and under illumination. Persistent changes in the polarization of the perovskite films were observed following positive or negative poling leading to significant changes in the observed current density and residual current at zero applied bias. At higher bias voltages additional inverted hysteresis loops were measured pointing at a decrease in barrier width and/or height at the blocking perovskite/metal contact by migrating iodide ions. Correspondingly, the net I – V characteristics in this voltage range could be modeled by two diodes operated back‐to‐back. Time‐dependent studies were performed to analyze the decay of the different observed polarization phenomena in the films during either short‐circuit or continuous sweeping of the bias. Implications of such persistent polarization and barrier formation for use of the materials for next‐generation solar cell devices are discussed.

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