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Substructural investigations, Raman, and FTIR spectroscopies of nanocrystalline ZnO films deposited by pulsed spray pyrolysis
Author(s) -
Dobrozhan O.,
Opanasyuk A.,
Kolesnyk M.,
Demydenko M.,
Cheong H.
Publication year - 2015
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.201532324
Subject(s) - nanocrystalline material , raman spectroscopy , analytical chemistry (journal) , wurtzite crystal structure , materials science , fourier transform infrared spectroscopy , raman scattering , substrate (aquarium) , optics , chemistry , zinc , nanotechnology , physics , chromatography , metallurgy , oceanography , geology
Nanocrystalline ZnO films were deposited onto glass substrates in the temperature range of 473–673 K using pulsed spray pyrolysis. The structural, substructural, and optical properties of the films were investigated by means of X‐ray diffraction analysis, Raman scattering, and Fourier transform infrared (FTIR) spectroscopy. The effect of the substrate temperature ( T s ) on the coherent scattering domain (CSD) sizes L , microstrains ϵ , and microstress σ grades, and the average density of dislocations ρ in the films were estimated through the broadening of X‐ray lines using the Cauchy and Gauss approximations and the threefold function convolution method. The ZnO films grown at T s = 623–673 K possessed the highest values of L , and the lowest of ϵ , σ , and ρ , indicating high‐crystalline quality. The Raman spectra showed peaks located at 95–98, 333–336, 415, 439–442, 572, and 578–584 cm −1 , which were interpreted as E 2 low (Zn), ( E 2 high − E 2 low ), E 1 (TO), E 2 high (O), A 1 (LO) and E 1 (LO) phonon modes of the ZnO wurtzite phase. The FTIR spectra showed relatively weak signals at 856, 1405, and 1560 cm −1 , corresponding to the C–H and C–O stretching modes, in addition to the main Zn–O mode at 475 cm −1 , indicating a low content of precursor residues.