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Thickness‐dependent magnetic properties of Ce 9 Fe 91 films
Author(s) -
Zhou Xueyun,
Wang Zhenkun,
Ge Shihui,
Wang Dianyuan,
Yu Jianmin,
Yao Dongsheng
Publication year - 2014
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.201431420
Subject(s) - materials science , condensed matter physics , anisotropy , sputter deposition , substrate (aquarium) , resonance (particle physics) , sputtering , magnetic anisotropy , optics , thin film , magnetization , magnetic field , nanotechnology , physics , atomic physics , oceanography , quantum mechanics , geology
Ce 9 Fe 91 lms with different thickness were fabricated by a rf magnetron sputtering method. The critical thickness t c for spin reorientation transition has been determined to be approximately 90 nm using the stripe domain model and magnetic force microscope. Above t c , the films exhibit Bloch stripe domain structure and a superhigh resonance frequency at 6 GHz is found for the ∥ stripe configuration. However, below t c , the lms possess an in‐plane uniaxial anisotropy caused by order interface tension between the film and substrate, and the resonance frequency breaks through the Snoek limit.