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Front Cover: Structural stratification of Sr 1 − x Ca x RuO 3 thin films: Influence of aging process (Phys. Status Solidi A 2/2013)
Author(s) -
Młynarczyk Marcin,
Szot Krzysztof,
Poppe Ulrich,
Breuer Uwe,
Mi Shaobo,
Psiuk Bronisław,
Görlich Edward A.,
Tomala Krzysztof,
Waser Rainer
Publication year - 2013
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Reports
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.201390003
Subject(s) - thin film , sputtering , materials science , analytical chemistry (journal) , rutherford backscattering spectrometry , epitaxy , scattering , condensed matter physics , layer (electronics) , chemistry , nanotechnology , optics , physics , chromatography
Ruthenates represent an attractive field of investigation both due to their physical properties (electric conductivity, superconductivity, magnetism – often unconventional) and for their possible technical applications. The heterogeneous in‐depth profile of the thin films is extremely important in the fabrication of nanodevices, especially those based on ultra‐thin layers. Młynarczyk et al. (pp. 239–254 ) systematically investigate structural features of epitaxial Sr 1 − x Ca x RuO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates with the use of high‐pressure dc‐sputtering. The series of samples were characterized with a number of complementary methods: X‐ray diffraction, Rutherford back‐scattering, high‐resolution transmission electron microscopy, time‐of‐flight secondary ion mass spectrometry, atomic force microscopy, and X‐ray photoemission spectroscopy were used to characterize both in‐depth and lateral structure features. Possible applications of Sr 1 − x Ca x RuO 3 thin films are largely determined by their thermal and chemical instability. Excessive process of aging was observed for the samples prepared with high pressure dc‐sputtering stored under normal conditions. Progressive stoichiometry instability at the surface layer in a presence of adsorbates should be noted as it significantly limits potential applications of these thin films.