Premium
Improving field‐emission properties of SiC nanowires treated by H 2 and N 2 plasma
Author(s) -
Li Zhenjiang,
Li Weidong,
Wang Xianlin,
Zhang Meng
Publication year - 2014
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.201330422
Subject(s) - field electron emission , transmission electron microscopy , materials science , nanowire , microstructure , scanning electron microscope , diffraction , field emission microscopy , plasma , analytical chemistry (journal) , nanotechnology , electron , composite material , optics , chemistry , physics , chromatography , quantum mechanics
β‐SiC nanowires (SiC NWs) were modified by H 2 and N 2 plasma treatment for improving the field‐emission (FE) properties. The FE property of SiC NWs treated by H 2 and N 2 plasma was significantly improved, their turn‐on field and threshold field were 3.2 and 6.7 V µm −1 for a 10‐min H 2 treatment, 3.0 and 6.3 V µm −1 for a 20‐min H 2 treatment, and 2.8 and 6.0 V µm −1 for a 10‐min N 2 treatment, respectively, while SiC NWs treated by N 2 for 20 min displayed poorer FE properties compared with untreated SiC NWs. The results of scanning electron microscope (FE‐SEM), transmission electron microscopy, high‐resolution transmission electron microscopy, selected‐area electronic diffraction, and X‐ray diffraction showed that the surface of the SiC NWs became rough, but their microstructure did not change after the plasma treatments. The point effect was proposed to explain the improvement of FE properties. A new, simple, and effective method for improving SiC NWs FE properties was discovered, and it may serve as a referential work for enhancing FE properties of other one‐dimensional nonmaterials.