Premium
Drift mobility of thermalized and highly energetic holes in thin layers of amorphous dielectric SiC
Author(s) -
Sielski Jan,
Jeszka Jeremiasz K.
Publication year - 2012
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.201228179
Subject(s) - electric field , dielectric , charge carrier , materials science , electron mobility , amorphous solid , drift velocity , saturation velocity , condensed matter physics , drift current , electron , charge (physics) , optoelectronics , physics , chemistry , organic chemistry , quantum mechanics
Abstract The development of new technology in the electronics industry requires new dielectric materials. It is also important to understand the charge‐carrier transport mechanism in these materials. We examined the hole drift mobility in amorphous SiC dielectric thin films using the time‐of‐flight (TOF) method. Charge carriers were generated using an electron gun. The generated holes gave a dispersive TOF signal and the mobility was low. For electric field strengths above 4 × 10 5 V cm −1 the drift mobility shows a very strong dependence on the electric field and a weak temperature dependence (transport of “high‐energy” charge carriers). At lower electric fields and for thermalized charge carriers the mobility is practically field independent and thermally activated. The observed phenomenon was attributed to the changes in the effective energy of the generated carriers moving in the high electric fields and consequently in the density of localized states taking part in the transport.