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Front Cover: Coherent X‐ray nanodiffraction on single GaAs nanowires (Phys. Status Solidi A 11/2011)
Author(s) -
Gulden J.,
Mariager S. O.,
Mancuso A. P.,
Yefanov O. M.,
Baltser J.,
Krogstrup P.,
Patommel J.,
Burghammer M.,
Feidenhans'l R.,
Vartanyants I. A.
Publication year - 2011
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Reports
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.201190035
Subject(s) - diffraction , nanowire , optics , materials science , reciprocal lattice , synchrotron radiation , cover (algebra) , bragg's law , synchrotron , x ray , bragg peak , physics , optoelectronics , mechanical engineering , beam (structure) , engineering
Gulden et al. ( pp. 2495‐2498 ) performed a coherent diffraction experiment on single GaAs nanowires. For this experiment, the hard X‐ray nanobeam scanning X‐ray microscope at ID 13 of the European Synchrotron Radiation Facility (ESRF) was used. Diffraction patterns in the vicinity of a Bragg peak were measured locally in a small region of a selected nanowire, and the origin of the different features is explained. The cover image shows a 3D isosurface of the scattered intensity in the vicinity of the Bragg peak in reciprocal space combined of 60 diffraction patterns. With further development of the method, Coherent X‐Ray Diffractive Imaging (CXDI) can possibly provide high resolution images of complicated nanowire structures.