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GISAXS and AFM study of self‐assembled Fe 2 O 3 nanoparticles and Si nanodots
Author(s) -
Ulyanenkov A.,
Chrost J.,
Siffalovic P.,
Chitu L.,
Majkova E.,
Erlacher K.,
Guerault H.,
Maier G.,
Cornejo M.,
Ziberi B.,
Frost F.
Publication year - 2011
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.201184273
Subject(s) - grazing incidence small angle scattering , nanodot , materials science , nanoparticle , silicon , scattering , range (aeronautics) , particle (ecology) , nanotechnology , analytical chemistry (journal) , optics , optoelectronics , chemistry , small angle neutron scattering , physics , oceanography , neutron scattering , chromatography , geology , composite material
The self‐assembled iron oxide nanoparticles synthesized by a high‐temperature solution phase reaction and the silicon dots produced by an ion bombardment have been investigated by using atomic force microscopy (AFM) and grazing‐incidence small‐angle scattering (GISAXS) technique. Both methods delivered the consistent results on the estimate for the particle size and shape and primary knowledge on the ordering of the objects. A distorted‐wave Born approximation approach has been used for X‐ray data fitting. In the case of the silicon dots, the dense long‐range particle distribution over the whole sample surface is found, where as FeO nanoparticles exhibit the short‐range correlations. Both results are consistent with the local AFM investigations.