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Coherent X‐ray nanodiffraction on single GaAs nanowires
Author(s) -
Gulden J.,
Mariager S. O.,
Mancuso A. P.,
Yefanov O. M.,
Baltser J.,
Krogstrup P.,
Patommel J.,
Burghammer M.,
Feidenhans'l R.,
Vartanyants I. A.
Publication year - 2011
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.201184261
Subject(s) - diffraction , nanowire , materials science , x ray , x ray crystallography , yield (engineering) , bragg's law , optics , coherent diffraction imaging , bragg peak , crystallography , diffraction topography , optoelectronics , physics , chemistry , fourier transform , quantum mechanics , metallurgy , phase retrieval , beam (structure)
Coherent X‐ray nanodiffraction was applied to investigate single GaAs nanowires. Using the nanofocus hard X‐ray setup at ID13 of the ESRF, the diffraction signal from isolated nanowires was measured. The diffraction patterns were recorded for different rotations of the sample. These diffraction patterns were then combined to yield three‐dimensional information around a Wurzite [101] Bragg peak.