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Short range correlations of misfit dislocations in the X‐ray diffraction peaks
Author(s) -
Kaganer Vladimir M.,
Sabelfeld Karl K.
Publication year - 2011
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.201184255
Subject(s) - diffraction , dislocation , materials science , condensed matter physics , monte carlo method , range (aeronautics) , markov chain , crystallography , physics , optics , mathematics , chemistry , statistics , composite material
The X‐ray diffraction peak profiles due to misfit dislocations are studied for the dislocations correlated on distances much smaller than the film thickness. Simple analytical expressions for the correlation parameter are obtained when the dislocations are generated as a Markov chain. Monte Carlo calculations show the peak profile evolution as order in the dislocation positions increases.