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Dynamical X‐ray diffractometry of the defect structure of garnet crystals
Author(s) -
Pylypiv V. M.,
Vladimirova T. P.,
Fodchuk I. M.,
Ostafiychuk B. K.,
Kyslovskyy Ye. M.,
Molodkin V. B.,
Olikhovskii S. I.,
Reshetnyk O. V.,
Skakunova O. S.,
Lizunov V. V.,
Garpul' O. Z.
Publication year - 2011
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.201184254
Subject(s) - diffraction , gadolinium gallium garnet , x ray , gallium , crystallography , materials science , crystal (programming language) , gadolinium , characterization (materials science) , basis (linear algebra) , x ray crystallography , single crystal , bent molecular geometry , chemistry , optics , physics , nanotechnology , mathematics , geometry , computer science , metallurgy , epitaxy , layer (electronics) , programming language , composite material
The generalized statistical dynamical theory of X‐ray diffraction by imperfect single crystals is applied for the structural characterization of real single crystals with complex basis, namely, gadolinium gallium garnet (GGG) crystal Gd 3 Ga 5 O 12 . The developed theoretical approach takes into account the presence of various structural defects as well as provides the self‐consistent description of coherent and diffuse components of diffraction profiles from such crystals. The characteristics of microdefects in the investigated GGG single crystal have been determined by analyzing the rocking curves measured for 444 and 888 reflections of CuKα 1 radiation.