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Nanoscale piezoresponse, acoustic and thermal microscopy of electronic ceramics
Author(s) -
Leng Xue,
Zeng Huarong,
Liu Liming,
Zhao Kunyu,
Zeng Jiangtao,
Li Guorong,
Yin Qingrui
Publication year - 2011
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.201000075
Subject(s) - piezoresponse force microscopy , scanning thermal microscopy , materials science , scanning probe microscopy , microscopy , nanoscopic scale , acoustic microscopy , ceramic , microstructure , microscope , electronic materials , nanotechnology , scanning force microscopy , thermal , atomic force microscopy , ferroelectricity , optoelectronics , optics , composite material , physics , dielectric , meteorology
Piezoresponse force microscopy (PFM), scanning probe acoustic microscopy (SPAM) and scanning thermal microscopy (SThM) for visualising ferroelectric microstructure were successfully developed based on a commercial atomic force microscope, and their basic principle and applications to electronic ceramics were described as well. PFM, SPAM and SThM provide powerful tools for local electromechnical, elastic and thermal property of electronic ceramics.