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Cover Picture: phys. stat. sol. (a) 205/11
Publication year - 2008
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Reports
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200890014
Subject(s) - dielectric spectroscopy , semiconductor , engineering physics , solar cell , cover (algebra) , physics , optoelectronics , electrical engineering , materials science , optics , engineering , electrochemistry , mechanical engineering , quantum mechanics , electrode
Commercial state‐of‐the‐art silicon solar cells are already quite advanced with respect to efficiency and cost. Further progress in this field, therefore, relies on a detailed analysis of solar cell parameters, e.g. short‐circuit currents, life‐time or surface recombination properties. Measuring these parameters with sufficient spatial resolution in reasonable time is not an easy task. The authors show how relevant parameters can be obtained by using a special kind of FFT impedance spectroscopy where the intensity of the local illumination is modulated and the response of the current under special short‐circuit conditions is measured (see the Feature Article on pp. 2485–2503). First author Jürgen Carstensen currently works as a research associate in the group of Prof. Helmut Föll at the Institute for materials science (Christian‐Albrechts‐University Kiel, Germany). In his research he employs semiconductor electrochemistry for the mapping of minority carrier life‐time in solar cell substrates and in the emerging fields of porous semiconductors and related phenomena of self‐organization. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)