Lattice parameter determination by coincidental multi‐beam X‐ray diffraction | Zendy

Borcha Mariana | Zendy; Fodchuk Igor | Zendy; Krytsun Igor | Zendy

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Lattice parameter determination by coincidental multi‐beam X‐ray diffraction

Author(s) -

Borcha Mariana,

Fodchuk Igor,

Krytsun Igor

Publication year - 2009

Publication title -

physica status solidi (a)

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.532

H-Index - 104

eISSN - 1862-6319

pISSN - 1862-6300

DOI - 10.1002/pssa.200881617

Subject(s) - superposition principle , diffraction , lattice (music) , scattering , lattice constant , beam (structure) , silicon , x ray , x ray crystallography , optics , computational physics , materials science , physics , quantum mechanics , optoelectronics , acoustics

High‐precision determination of the absolute value of lattice parameter for cubic single crystals is demonstrated by the example of silicon using coincidental multi‐beam X‐ray diffraction realized by superposition of two three‐beam reflections at fixed sample temperature. Based on a semi‐kinematical approximation of X‐ray scattering theory, the algorithm for calculation of multi‐beam diffractograms is developed enabling a more thorough quantitative analysis of experimental results.

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