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A synchrotron tensile test setup for nanocrystalline thin films
Author(s) -
Ulyanenkova T.,
Baumbusch R.,
Filatova T.,
Doyle S.,
Castrup A.,
Gruber P. A.,
Markmann J.,
Weissmüller J.,
Baumbach T.,
Hahn H.,
Kraft O.
Publication year - 2009
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200881599
Subject(s) - nanocrystalline material , materials science , synchrotron , ultimate tensile strength , tensile testing , diffraction , thin film , deformation (meteorology) , composite material , palladium , optics , nanotechnology , chemistry , physics , biochemistry , catalysis
The current report covers the establishment of an in situ X‐ray diffraction tensile experiment at the synchrotron ANKA located at Forschungszentrum Karlsruhe for probing diffraction signals from nanocrystalline thin films during tensile deformation. Measurements on nanocrystalline palladium films verify the capabilities of the setup.