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Fred H. Pollak († 19 June 2008)
Author(s) -
Muñoz Martin,
Huang YingSheng
Publication year - 2009
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200881416
Subject(s) - library science , engineering physics , graduate students , state (computer science) , management , engineering , physics , medicine , medical education , computer science , algorithm , economics
Fred Hugo Pollak was born in Vienna, Austria and educated in the United States. After receiving his Ph.D. in Physics from the University of Chicago in 1965, Fred became Associate Professor of Physics at Brown University (1966–1972) and then Professor of Physics and Director of the Maxwell Maybaum Institute of Material Science and Quantum Electronics at the Belfar Graduate School of Science at Yeshiva University (1972–1978). He joined the Department of Physics at Brooklyn College in 1978 and was appointed as a CUNY Distinguished Professor in 1988. Complementing his roles in the Physics Department of Brooklyn College and the Ph.D. Program in Physics at the Graduate Center of the CUNY, Professor Pollak also served as Deputy Director of the New York State Center for Advanced Technology in Ultrafast Photonic Materials and Applications at the CUNY and Associate Director and Head of the Materials Group, New York State Center for Advanced Technology in Telecommunication at Polytechnic University. Fred also participated in the Committee of Concerned Scientists and has been director and fellow of the Society of Photo‐Optical Instrumentation Engineers and fellow of the American Physical Society and a member of the Electrochemical Society. During his academic career, Professor Pollak was also president of Semiconductor Characterization Instruments, a company which was involved in the design and manufacturing of quality control instruments for the semiconductor industry. Professor Pollak was one of the founders of the technique of modulation spectroscopy and a pioneer in the use of modulation spectroscopy to study semiconductor structures such as superlattices, quantum wells and heterojunctions. He was also among the first to apply Raman spectroscopy techniques in studying the effects of uniaxial stress on phonon frequencies, providing new insight into the nature of anharmonic forces in semiconducting materials and systems. He was a tireless pioneer in the application of spectroscopic techniques to characterize semiconductor systems, a highly valued collaborator in research, an inspiring teacher/mentor to numerous students, and a great friend to many (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)