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Controlling the optical properties of nanostructured TiO 2 thin films
Author(s) -
Hawkeye Matthew M.,
Brett Michael J.
Publication year - 2009
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200881297
Subject(s) - materials science , refractive index , thin film , scanning electron microscope , isotropy , deposition (geology) , optics , homogeneous , reflectivity , range (aeronautics) , optoelectronics , nanotechnology , composite material , physics , paleontology , sediment , biology , thermodynamics
We have studied the optical properties of nanostructured TiO 2 films and demonstrated the ability to tune the refractive index of the material over a wide range. The nanostructured films are fabricated using glancing angle deposition, which provides the ability to precisely control the density of the deposited film. Film morphology was examined using scanning electron microscopy and the films were optically characterized by polarized‐reflectance measurements. A simple isotropic homogeneous model, which is shown to be a good approximation of the film, is used to determine the optical constants from the reflectance measurements. Improvements to the model are suggested. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)