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Substrate‐temperature effect on the microstructural and optical properties of ZnS thin films obtained by close‐spaced vacuum sublimation
Author(s) -
Kurbatov D.,
Opanasyuk A.,
Khlyap H.
Publication year - 2009
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200824472
Subject(s) - sublimation (psychology) , materials science , refractive index , thin film , diffraction , molar absorptivity , scattering , scanning electron microscope , surface finish , optics , analytical chemistry (journal) , composite material , chemistry , optoelectronics , nanotechnology , psychotherapist , psychology , physics , chromatography
The effect of substrate temperature ( T s = 373–973 K) on the structural and optical properties of ZnS films obtained by a close‐spaced vacuum sublimation technique has been studied. Examination of layers morphology and structure was performed by scanning electron microscopy and X‐ray diffraction methods. The results of these studies enabled determination of the dependence of the main structural film parameters (texture, surface roughness, lattice parameters, grain and X‐ray scattering domain sizes, microstrain) on the growth conditions. Optical characteristics were studied in the range of wavelength near the “red edge” of ZnS photoconductivity. Spectral distributions of transmission coefficient T ( λ ), refractive index n ( λ ), extinction coefficient k ( λ ) and their dependence on the deposition temperature of ZnS films are obtained. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)