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The structural, morphological and magnetic characteristics of Mn‐implanted nonpolar a ‐plane GaN films
Author(s) -
Sun Lili,
Yan Fawang,
Wang Junxi,
Zeng Yiping,
Wang Guohong,
Li Jinmin
Publication year - 2009
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200824170
Subject(s) - annealing (glass) , diffraction , materials science , ferromagnetism , atomic force microscopy , condensed matter physics , magnetic semiconductor , doping , analytical chemistry (journal) , crystallography , nanotechnology , chemistry , optics , optoelectronics , composite material , physics , chromatography
Dilute magnetic nonpolar GaN films have been fabricated by implanting Mn into unintentionally doped nonpolar a ‐plane GaN films at room temperature, and a subsequent rapid thermal annealing. The X‐ray diffraction analysis shows that after rapid thermal annealing the peak of the GaN X‐ray diffraction curve shifts to a lower angle, indicating a slight expansion of the GaN crystal lattice. Atomic force microscopy analysis shows that the annealing process does not change the morphology of the sample greatly. Magnetic property analysis indicates that the as‐annealed sample shows obvious ferromagnetic properties. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)