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Characterization of preferred orientated vanadium dioxide film on muscovite (001) substrate
Author(s) -
Yan Jiazhen,
Huang Wanxia,
Zhang Yue,
Liu Xiaojie,
Tu Mingjin
Publication year - 2008
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200779402
Subject(s) - muscovite , materials science , annealing (glass) , electrical resistivity and conductivity , monoclinic crystal system , vanadium oxide , thin film , vanadium , analytical chemistry (journal) , crystallography , composite material , chemistry , nanotechnology , metallurgy , crystal structure , quartz , chromatography , electrical engineering , engineering
In this paper, a natural muscovite slice is used as the substrate for deposition of the vanadium dioxide films. Vanadium oxide gel films are fabricated on the muscovite (001) cleavage plane by an aqueous sol–gel method, then the films are crystallized and reduced to vanadium dioxide by annealing in static N 2 atmosphere at a temperature of 480 °C. The X‐ray patterns of the reduced films exhibit the unique diffraction peak of the monoclinic VO 2 (011) plane. The result indicates that the films are perfectly (011) orientated on muscovite (001) plane. The optic and electrical properties of the films are investigated below and above the metal‐to‐isolator phase‐transition temperature. The thermochromic VO 2 films on muscovite exhibit changes in electrical resistivity more than three orders of magnitude, while infrared transmittance switches more than 60% in the wave number range of 4000–2000 cm –1 . (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)