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Polarization optics of interfaces and thin films
Author(s) -
Azzam R. M. A.
Publication year - 2008
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200777745
Subject(s) - polarizer , optics , polarization (electrochemistry) , ellipsometry , thin film , beam splitter , materials science , optoelectronics , waveplate , reflection (computer programming) , physics , birefringence , chemistry , nanotechnology , laser , computer science , programming language
The differential reflection of p‐ and s‐polarized light by interfaces and thin films is central to the theory and applications of ellipsometry. It is also the basis of a wide variety of optical devices for the control and analysis of polarized light such as polarizers, polarizing and polarization‐preserving beam splitters, and quarter‐wave and half‐wave retarders. New insight into the correlation between optical properties of film and substrate materials and reflection properties is emphasized. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)