Premium
Microwave measurement uncertainty due to applied magnetic field
Author(s) -
Perero S.,
Pasquale M.
Publication year - 2007
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200777328
Subject(s) - calibration , microwave , field (mathematics) , measurement uncertainty , magnetic field , spectrum analyzer , focus (optics) , range (aeronautics) , computer science , uncertainty analysis , network analyzer (electrical) , materials science , electronic engineering , physics , computational physics , optics , engineering , telecommunications , simulation , mathematics , quantum mechanics , pure mathematics , composite material
Abstract In recent years there has been a wide interest in the production and analysis of films and nanostructures of different types for their microwave properties up to the mm‐wave range. In order to characterize the electromagnetic behavior of these devices new experimental techniques need to be developed and assessed. Typically the measurements involve the use of vector network analyzer, and require several calibration steps. In this paper, we present a summary of the calibration techniques and evaluate the uncertainties obtained under different conditions, with a particular focus on the effect of the applied magnetic field upon uncertainty. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)