Electrostatic force microscopy study of electrical conductivity of hydrogen‐terminated CVD diamond films | Zendy

Volodin A. | Zendy; Toma C. | Zendy; Bogdan G. | Zendy; Deferme W. | Zendy; Haenen K. | Zendy; Neslàdek M. | Zendy; Van Haesendonck C. | Zendy

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Electrostatic force microscopy study of electrical conductivity of hydrogen‐terminated CVD diamond films

Author(s) -

Volodin A.,

Toma C.,

Bogdan G.,

Deferme W.,

Haenen K.,

Neslàdek M.,

Van Haesendonck C.

Publication year - 2007

Publication title -

physica status solidi (a)

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.532

H-Index - 104

eISSN - 1862-6319

pISSN - 1862-6300

DOI - 10.1002/pssa.200776334

Subject(s) - diamond , electrostatic force microscope , materials science , electrical conductor , surface conductivity , conductivity , sheet resistance , electrical resistivity and conductivity , conductive atomic force microscopy , drop (telecommunication) , electrode , hydrogen , voltage drop , composite material , nanotechnology , analytical chemistry (journal) , voltage , chemistry , atomic force microscopy , electrical engineering , layer (electronics) , engineering , organic chemistry , chromatography

Electrostatic force microscopy (EFM) has been used to probe the conducting properties of the hydrogen‐terminated (H‐terminated) surface of CVD diamond films. Two parallel electrodes, separated by a distance of 100 µm, are fabricated on the sample surface. EFM images the voltage distribution over a current‐carrying H‐terminated diamond film. The almost linear voltage drop in highly conductive H‐terminated diamond surface layers indicates that the layers behave as diffusive conductors with a well‐defined value of the sheet resistance. On the other hand, conductive as well as insulating regions are observed to coexist for H‐terminated diamond surfaces with poor electric conductivity. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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