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Study of cross‐sections of magnetite thin films by means of electron backscatter diffraction (EBSD)
Author(s) -
KoblischkaVeneva A.,
Koblischka M. R.,
Mücklich F.,
Hartmann U.
Publication year - 2008
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200723634
Subject(s) - electron backscatter diffraction , magnetite , misorientation , materials science , electron diffraction , substrate (aquarium) , thin film , thin section , diffraction , grain boundary , crystallography , mineralogy , metallurgy , optics , microstructure , geology , chemistry , nanotechnology , physics , oceanography
By means of electron backscatter diffraction (EBSD), we studied the grain orientation of cross‐sections of magnetite (Fe 3 O 4 ) thin films grown on (001) oriented MgO substrates. Earlier studies showed that the magnetic properties of the magnetite films are dominated by the presence of so‐called anti‐phase boundaries (APBs). The use of cross‐sections of thin‐films enables to study the growth mechanism in a more direct way. The EBSD maps reveal that the first magnetite layer on the MgO substrate is comprised of many small, misoriented magnetite grains. Subsequent layers show the desired (001) orientation with a ±5° misorientation. The misorientations found in the cross‐section of the film resemble those obtained in EBSD measurements at the sample surface. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)