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Perpendicular anisotropy in Fe/Ag multilayers
Author(s) -
Balogh J.,
Fetzer Cs.,
Kaptás D.,
Kiss L. F.,
Szűcs I. S.,
Dézsi I.,
Vincze I.
Publication year - 2008
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200723632
Subject(s) - substrate (aquarium) , magnetization , materials science , anisotropy , layer (electronics) , conversion electron mössbauer spectroscopy , mössbauer spectroscopy , condensed matter physics , perpendicular , spectroscopy , evaporation , vacuum evaporation , transmission electron microscopy , magnetic anisotropy , thin film , spontaneous magnetization , analytical chemistry (journal) , crystallography , chemistry , mössbauer effect , optics , nanotechnology , magnetic field , physics , oceanography , geometry , mathematics , chromatography , quantum mechanics , thermodynamics , geology
The direction of the spontaneous magnetization changes from out of plane to in plane at around x = 0.6 in [Ag(2.6 nm)/Fe( x nm)] 10 multilayers (0.2 ≤ x ≤ 1) prepared on Si(111) substrate by vacuum evaporation. Transmission Mössbauer spectroscopy measurements of removed samples with a thick capping layer are compared to conversion electron Mössbauer spectroscopy measurements of samples on the Si substrate with a thin capping layer. The stress arising because of the application of a thick capping layer and the removal of the samples from the substrate is shown to have negligible effect on the spontaneous magnetization. The results support that the appearance of the perpendicular anisotropy below x = 0.6 is an intrinsic property of Fe/Ag multilayers. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)