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Shape effect of microtwins on high‐resolution transmission electron microscope images
Author(s) -
Kuramochi K.,
Yamazaki T.,
Nakanishi N.,
Hashimoto I.,
Watanabe K.
Publication year - 2008
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200723491
Subject(s) - high resolution transmission electron microscopy , transmission electron microscopy , electron microscope , crystal twinning , high resolution , materials science , chemistry , optics , crystallography , physics , nanotechnology , geology , microstructure , remote sensing
Abstract The shape effect of microtwins on high‐resolution transmission electron microscopy (HRTEM) images is demonstrated with the help of a detailed comparison between experimental HRTEM images of recrystallized silicon (including many microtwins) and corresponding dynamical simulations. The analysis points to an important fact: The shape effect of microtwins leads to artificial contrasts. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)