Shape effect of microtwins on high‐resolution transmission electron microscope images | Zendy

Kuramochi K. | Zendy; Yamazaki T. | Zendy; Nakanishi N. | Zendy; Hashimoto I. | Zendy; Watanabe K. | Zendy

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Shape effect of microtwins on high‐resolution transmission electron microscope images

Author(s) -

Kuramochi K.,

Yamazaki T.,

Nakanishi N.,

Hashimoto I.,

Watanabe K.

Publication year - 2008

Publication title -

physica status solidi (a)

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.532

H-Index - 104

eISSN - 1862-6319

pISSN - 1862-6300

DOI - 10.1002/pssa.200723491

Subject(s) - high resolution transmission electron microscopy , transmission electron microscopy , electron microscope , crystal twinning , high resolution , materials science , chemistry , optics , crystallography , physics , nanotechnology , geology , microstructure , remote sensing

The shape effect of microtwins on high‐resolution transmission electron microscopy (HRTEM) images is demonstrated with the help of a detailed comparison between experimental HRTEM images of recrystallized silicon (including many microtwins) and corresponding dynamical simulations. The analysis points to an important fact: The shape effect of microtwins leads to artificial contrasts. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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