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Molecular beam deposition and characterization of thin organic films on metals for applications in organic electronics
Author(s) -
Witte G.,
Wöll Ch.
Publication year - 2008
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200723433
Subject(s) - rubrene , pentacene , organic semiconductor , organic electronics , molecular electronics , materials science , deposition (geology) , context (archaeology) , characterization (materials science) , nanotechnology , thin film , charge carrier , electronics , molecule , optoelectronics , chemical physics , chemistry , thin film transistor , transistor , organic chemistry , physics , voltage , layer (electronics) , paleontology , sediment , biology , quantum mechanics
The deposition of organic thin films on metal substrates using molecular beam deposition will be reviewed with a special emphasis on molecules which exhibit high charge carrier mobilities and are thus suited to be used as organic semiconductors (OSCs), namely pentacene, rubrene and perylene. Special emphasis will be on aspects of organic molecular beam deposition (OMBD) relevant for the device performance in organic field effect transistors (OFETs), in particular with regard to avoiding or minimizing structural defects at support/OSC interfaces. In addition, another aspect governing – and often limiting – charge injection at electrodes into an OSC, electronic level alignment at molecule/metal interfaces, will be discussed in the context of recent accurate ab‐initio electronic structure calculations. Finally, we will present a novel experimental approach to determine charge transport properties of defect‐free, nm‐sized OSCs where extrinsic contributions to e.g. charge carrier mobilities can be strictly excluded, thus opening the way towards the determination of true intrinsic OSC properties. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)