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Crystallization behavior of Sb 70 Te 30 and Ag 3 In 5 Sb 60 Te 32 chalcogenide materials for optical media applications
Author(s) -
Lee M. L.,
Shi L. P.,
Tian Y. T.,
Gan C. L.,
Miao X. S.
Publication year - 2008
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200723398
Subject(s) - crystallization , chalcogenide , materials science , eutectic system , amorphous solid , thermal stability , melting point , chalcogen , analytical chemistry (journal) , refractive index , crystallography , antimony , microstructure , chemistry , metallurgy , thermodynamics , physics , optoelectronics , organic chemistry , chromatography , composite material
Addition of In and Ag into eutectic Sb 70 Te 30 fast‐growth material was studied. We explored the optical transitions and crystallization kinetics of Sb 70 Te 30 and Ag 3 In 5 Sb 60 Te 32 recording films. The results showed that Ag 3 In 5 Sb 60 Te 32 has a higher crystallization temperature but a similar melting point compared to Sb 70 Te 30 . In both the crystalline and amorphous states, addition of Ag and In increased the refractive index and decreased the extinction coefficient of Sb 70 Te 30 . Ag 3 In 5 Sb 60 Te 32 has better thermal stability and a lower crystallization speed than Sb 70 Te 30 film. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)