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Structural and optical properties of Cu 3 SnS 4 sprayed thin films
Author(s) -
Bouaziz M.,
Ouerfelli J.,
Amlouk M.,
Belgacem S.
Publication year - 2007
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200723086
Subject(s) - crystallite , thin film , tetragonal crystal system , materials science , band gap , annealing (glass) , substrate (aquarium) , diffraction , crystallography , spray pyrolysis , analytical chemistry (journal) , x ray crystallography , crystal structure , chemistry , nanotechnology , optics , metallurgy , optoelectronics , physics , oceanography , chromatography , geology
This paper reports the successful deposition of Cu 3 SnS 4 thin films using a spray pyrolysis technique. These films were deposited on glass substrates using a solution containing CuCl 2 · 2H 2 O, SnCl 2 · 2H 2 O and SC(NH 2 ) 2 as precursors with appropriate chemical compositions of elements ([Sn] = 10 –2 M and [Cu]/[Sn] = 2 × 2.2) at a substrate temperature of 360 °C. X‐ray diffraction analysis show that unannealed and annealed Cu 3 SnS 4 thin films under sulphur atmosphere crystallise in the tetragonal structure and the crystallites exhibit preferential (112) orientation of the grains. Optical measurements show that Cu 3 SnS 4 sprayed thin film annealed at 500 °C has a direct band gap of about 1.22 eV. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)