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Analyzer‐based X‐ray phase contrast imaging with four bounce Si(444) monochromators at ELETTRA
Author(s) -
Hönnicke M. G.,
Rigon L.,
Arfelli F.,
Menk R.H.,
Cusatis C.
Publication year - 2007
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200675674
Subject(s) - optics , physics , spectrum analyzer , phase contrast imaging , beamline , visibility , contrast (vision) , phase (matter) , sensitivity (control systems) , x ray , solid angle , phase contrast microscopy , detector , beam (structure) , engineering , quantum mechanics , electronic engineering
An analyzer‐based X‐ray phase contrast imaging setup (ABI) based on four bounce Si(444) monochromators at 18 keV mounted at the SYRMEP beamline at Elettra is presented. The system was stable for the employed exposure times. Contrasts, visibility of the object edges and signal to noise ratio of the acquired images were studied. Simulation procedures of the images were also exploited. The results show that such setup can be used for high sensitivity (high contrast) experiments at Elettra. Also, due to intrinsic properties, this setup can be useful for future ultra‐small angle X‐ray scattering experiments. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)