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Porous surface statistical characterization via fluorescence correlation spectroscopy
Author(s) -
Plain J.,
Jaffiol R.,
Lerondel G.,
Royer P.
Publication year - 2007
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200674404
Subject(s) - mesoscopic physics , porosity , porous silicon , materials science , characterization (materials science) , fluorescence correlation spectroscopy , luminescence , fluorescence , spectroscopy , fluorescence spectroscopy , chemical engineering , porous medium , silicon , nanotechnology , analytical chemistry (journal) , chemistry , composite material , optics , optoelectronics , chromatography , physics , engineering , quantum mechanics
The characterization of the porosity or of the pore density is a very important issue for porous materials. We report on a new technique allowing a direct measure of the surface pore density. The number of pores on porous silicon substrates has been measured using fluorescence correlation spectroscopy, a technique that is generally applied in solution to study molecules diffusing through a small observation volume. This technique is used to measure the surface density of luminescent pores in a mesoscopic porous silicon layer. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)