Brillouin light scattering from porous silicon films and multilayers | Zendy

Andrews G. T. | Zendy; Polomska A. M. | Zendy; Vazsonyi E. | Zendy; Volk J. | Zendy

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Brillouin light scattering from porous silicon films and multilayers

Author(s) -

Andrews G. T.,

Polomska A. M.,

Vazsonyi E.,

Volk J.

Publication year - 2007

Publication title -

physica status solidi (a)

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.532

H-Index - 104

eISSN - 1862-6319

pISSN - 1862-6300

DOI - 10.1002/pssa.200674344

Subject(s) - porous silicon , materials science , brillouin spectroscopy , silicon , brillouin zone , porosity , rayleigh scattering , crystallite , layer (electronics) , brillouin scattering , phonon , optics , composite material , condensed matter physics , optoelectronics , optical fiber , physics , metallurgy

Porous silicon films and multilayers were studied using Brillouin spectroscopy. Acoustic wave velocities and elastic constants were determined for films with porosity ∼0.60 formed from p – , p + and n + crystalline silicon. The velocities and elastic constants depend on the pore/crystallite geometry and morphology. Porous silicon multilayers were fabricated from (100) p + crystalline silicon. For a multilayer with 250 nm layer thickness and layer porosity sequence of 0.45/0.65/0.45/0.65/0.45, the Rayleigh surface phonon velocity was found to be 2850 m/s. The origin(s) of other peaks in the multilayer spectra are unknown but it is unlikely that they are surface modes because their shift(s) are independent of incident angle. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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