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Spectroscopic phase modulated ellipsometry in application to some novel single and polycrystalline ternary compounds
Author(s) -
Mamedov N.,
Shim Y.,
Toyota H.,
Wakita K.,
Yamamoto N.,
Iida S.
Publication year - 2006
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200669656
Subject(s) - ellipsometry , specular reflection , crystallite , ternary operation , materials science , optics , anisotropy , dielectric , phase (matter) , polarization (electrochemistry) , analytical chemistry (journal) , thin film , optoelectronics , chemistry , nanotechnology , physics , organic chemistry , computer science , metallurgy , programming language , chromatography
The results of the application of the spectroscopic phase modulated ellipsometry (SPME) to a series of novel ternary compounds from anisotropic to polycrystalline are presented to show the high effectiveness of this optical technique with regard to the dielectric function of the new materials. Besides, SPME in specular reflection mode to study the polarization degree of the light reflected at specular angle is shown to be very informative in determination of the best conditions for optical measurements on rough surfaces such as, for example, surfaces of the polycrystalline ternary thiogallate compounds studied in this work. An incoherent approach relating the measured depolarization with the surface variance and optical constants of a material or thin film is proposed. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)