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Deposition of thallium sulfide layers on polyethylene and nanostructured silica by a sulfurisation‐reaction process
Author(s) -
Bruzaite Ingrida,
Snitka Valentinas,
Janickis Vitalijus
Publication year - 2006
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200566006
Subject(s) - scanning electron microscope , thallium , deposition (geology) , sulfide , materials science , polystyrene , substrate (aquarium) , homogeneous , analytical chemistry (journal) , chemical engineering , mineralogy , chemistry , metallurgy , composite material , polymer , organic chemistry , thermodynamics , physics , paleontology , oceanography , sediment , engineering , biology , geology
Thallium sulfide layers on the surface of polyethylene are formed if they have been sulfured in a solution of higher polythionic acid, H 2 S 33 O 6 , and then treated with the alkaline solution of thallium(I) sulfate. Three phases TlS, Tl 2 S, Tl 2 S 2 were identified by X‐ray diffraction analysis in thallium sulfide layers. Surface morphology of the films was characterized with a scanning electron microscope (SEM) and atomic force microscope (AFM). The films deposited on the PE substrate have a no‐homogeneous structure and consist of separated islands, the average roughness up to 10 µm. The deposition on the silica‐polystyrene beads matrix has a homogeneous structure and the average roughness is in the range of 100–150 nm. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)