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Optical characterization of polyethylene and cobalt phthalocyanine ultrathin films by means of the ATR technique at surface plasmon resonance
Author(s) -
Rodríguez Juárez M.,
Muñoz Aguirre N.,
Martínez Pérez L.,
GaribayFebles V.,
LozadaCassou M.,
Becerril M.,
Angel O. Zelaya
Publication year - 2006
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200521475
Subject(s) - materials science , surface plasmon resonance , phthalocyanine , thin film , attenuated total reflection , dielectric , polyethylene , surface plasmon , nanometre , optoelectronics , sputtering , cobalt , evaporation , optics , plasmon , nanotechnology , nanoparticle , infrared , composite material , physics , metallurgy , thermodynamics
It is well known that the development and determination of optical properties of ultrathin films is an important issue in many technological areas. In this work organic polyethylene (PE) and cobalt phthalocyanines (CoPc) ultrathin films were deposited over metal films using the r.f. sputtering and thermal evaporation techniques, respectively. Attenuated total reflection (ATR) measurements for the system organic film/metal at the surface plasmon resonance (SPR) were used for determining the thicknesses and optical properties of the PE and CoPc thin films. Thicknesses of the order of some nanometers were found, fitting the theoretical multilayer ATR model, for p polarization monochromatic light, to the experimental reflection data. The dielectric function of CoPc ultrathin films was determined at a wavelength of 632.8 nm. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)